Issued Patents All Time
Showing 51–75 of 79 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7071901 | Plasma display panel and imaging device using the same | Norihiro Uemura, Keizo Suzuki, Hiroshi Kajiyama, Yusuke Yajima, Masayuki Shibata +2 more | 2006-07-04 |
| 7071475 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Kaoru Umemura, Yuichi Madokoro, Yasunori Doi | 2006-07-04 |
| 6919670 | Rib structure for display device and its manufacture process | Yasuhiko Kunii, Tadashi Furukawa, Akihiro Fujinaga, Kazunori Ishizuka, Shoichi Iwanaga +2 more | 2005-07-19 |
| 6855026 | Method for forming partitions of plasma display panel by using sandblasting process | Akihiro Fujinaga, Kazunori Ishizuka, Tatsutoshi Kanae, Kazuhide Iwasaki, Toshiyuki Nanto +5 more | 2005-02-15 |
| 6844684 | Front film for flat display panel and flat display device using the same | Fumihiro Namiki, Akira Nakazawa | 2005-01-18 |
| 6828566 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Kaoru Umemura, Yuichi Madokoro, Yasunori Doi | 2004-12-07 |
| 6822627 | Plasma display panel and imaging device using the same | Norihiro Uemura, Keizo Suzuki, Hiroshi Kajiyama, Yusuke Yajima, Masayuki Shibata +2 more | 2004-11-23 |
| 6690342 | Plasma display device | Ken Yamamoto, Hiroshi Kajiyama, Keizo Suzuki, Masayuki Shibata, Yasuhiko Kunii | 2004-02-10 |
| 6608441 | Plasma display panel and method for manufacturing the same | Yasuhiko Kunii, Masayuki Shibata, Kenichi Yamamoto, Atsushi Yokoyama, Yusuke Yajima +4 more | 2003-08-19 |
| 6583426 | Projection ion beam machining apparatus | Kaoru Umemura, Yuuichi Madokoro, Satoshi Tomimatsu | 2003-06-24 |
| 6538254 | Method and apparatus for sample fabrication | Satoshi Tomimatsu, Kaoru Umemura, Yuichi Madokoro, Yasunori Doi | 2003-03-25 |
| 6333599 | Plasma display system | Keizo Suzuki, Kenichi Yamamoto, Shirun Ho, Masaji Ishigaki, Ryohei Satoh +3 more | 2001-12-25 |
| 6274876 | Inspection apparatus and method using particle beam and the particle-beam-applied apparatus | Akio Yoneyama, Tadashi Otaka | 2001-08-14 |
| 6140644 | Inspection apparatus and method using a particle beam | Akio Yoneyama, Tadashi Otaka | 2000-10-31 |
| 5910871 | Magnetic head having track width specified by grooves formed with projection ion beam | Hisashi Takano, Kaoru Umemura, Yuichi Madokoro, Satoshi Tomimatsu | 1999-06-08 |
| 5825035 | Processing method and apparatus using focused ion beam generating means | Michinobu Mizumura, Yuuichi Hamamura, Junzou Azuma, Akira Shimase, Takashi Kamimura +3 more | 1998-10-20 |
| 5767516 | Electron microscope and sample observing method using the same | Shigeyuki Hosoki | 1998-06-16 |
| 5583344 | Process method and apparatus using focused ion beam generating means | Michinobu Mizumura, Yuuichi Hamamura, Junzou Azuma, Akira Shimase, Takashi Kamimura +3 more | 1996-12-10 |
| 5554257 | Method of treating surfaces with atomic or molecular beam | Kenetsu Yokogawa, Tatsumi Mizutani | 1996-09-10 |
| 5532494 | Treatment and observation apparatus using scanning probe | Tsuyoshi Ohnishi | 1996-07-02 |
| 5504340 | Process method and apparatus using focused ion beam generating means | Michinobu Mizumura, Yuuichi Hamamura, Junzou Azuma, Akira Shimase, Takashi Kamimura +3 more | 1996-04-02 |
| 5120925 | Methods for device transplantation | Tsuyoshi Ohnishi, Yuuichi Madokoro, Kaoru Umemura, Tohru Ishitani | 1992-06-09 |
| 5077266 | Method of forming weak-link Josephson junction, and superconducting device employing the junction | Kazumasa Takagi, Tokuumi Fukazawa, Yuuichi Madokoro, Katsuki Miyauchi, Toshiyuki Aida +3 more | 1991-12-31 |
| 5065034 | Charged particle beam apparatus | Tsuyoshi Ohnishi, Tohru Ishitani, Tooru Habu, Masahiro Yamaoka | 1991-11-12 |
| 4939364 | Specimen or substrate cutting method using focused charged particle beam and secondary ion spectroscopic analysis method utilizing the cutting method | Tohru Ishitani, Tsuyoshi Ohnishi | 1990-07-03 |