TK

Takeshi Kawasaki

HI Hitachi: 25 patents #1,255 of 28,497Top 5%
Fujitsu Limited: 22 patents #1,239 of 24,456Top 6%
HH Hitachi High-Technologies: 22 patents #85 of 1,917Top 5%
Sumitomo Electric Industries: 10 patents #2,734 of 21,551Top 15%
ED Eudyna Devices: 5 patents #6 of 80Top 8%
SE Seiko Epson: 4 patents #3,385 of 7,774Top 45%
Kubota: 4 patents #505 of 2,059Top 25%
W& Webasto-Werk W. Baier Gmbh &: 1 patents #40 of 82Top 50%
DJ Doryokuro Kakunenryo Kaihatsu Jigyodan: 1 patents #104 of 393Top 30%
Nintendo Co.: 1 patents #886 of 1,476Top 65%
BI Biglobe: 1 patents #12 of 24Top 50%
Overall (All Time): #15,745 of 4,157,543Top 1%
96
Patents All Time

Issued Patents All Time

Showing 26–50 of 96 patents

Patent #TitleCo-InventorsDate
8168951 Charged particle beam apparatus Tomonori Nakano 2012-05-01
8129680 Charged particle beam apparatus including aberration corrector Kotoko Hirose, Tomonori Nakano 2012-03-06
8044433 GaN-based high electron mobility transistor (HEMT) with an embedded gate electrode having a first recess portion and a second recess portion to improve drain breakdown voltage Ken Nakata, Seiji Yaegashi 2011-10-25
7915582 Method for estimation of probe shape in charged particle beam instruments Kotoko Hirose, Haruo Yoda, Tomonori Nakano 2011-03-29
7872240 Corrector for charged-particle beam aberration and charged-particle beam apparatus Hiroyuki Ito, Yuko Sasaki, Yoshiya Higuchi 2011-01-18
7834326 Aberration corrector and charged particle beam apparatus using the same Noboru Moriya, Tomonori Nakano, Kotoko Hirose 2010-11-16
7825377 Electron beam apparatus with aberration corrector Takaho Yoshida, Yoichi Ose, Hideo Todokoro 2010-11-02
7728353 Semiconductor device in which GaN-based semiconductor layer is selectively formed Seiji Yaegashi, Ken Nakata 2010-06-01
7723751 Semiconductor device and fabrication method of the same Ken Nakata, Seiji Yaegashi 2010-05-25
7718976 Charged particle beam apparatus Mitsugu Sato, Makoto Ezumi, Tomonori Nakano 2010-05-18
7714286 Charged particle beam apparatus, aberration correction value calculation unit therefor, and aberration correction program therefor Tomonori Nakano, Kotoko Hirose, Makoto Ezumi 2010-05-11
7592647 Semiconductor device and manufacturing method thereof Ken Nakata, Seiji Yaegashi 2009-09-22
7531799 Charged particle beam column Takaho Yoshida, Tomonori Nakano 2009-05-12
7521675 Charged particle beam apparatus Tomonori Nakano 2009-04-21
7521707 Semiconductor device having GaN-based semiconductor layer Ken Nakata, Hiroshi Yano 2009-04-21
7504624 Charged particle beam device Tomonori Nakano, Michio Hatano, Momoyo Enyama 2009-03-17
7438047 Multi-cylinder engine Yutaka Teruumi, Koji Fujimura, Hiroshi Inoue, Tetsushi Karasawa, Seiji Izuhara 2008-10-21
7433958 Packet relay processing apparatus Kuniaki Shimada, Ken Yokoyama, Toshihiko Kurita, Tsuneo Katsuyama, Koichi Takaba +1 more 2008-10-07
7375323 Electron beam apparatus with aberration corrector Takaho Yoshida, Yoichi Ose, Hideo Todokoro 2008-05-20
7249654 Heat insulating acoustical structure and carbody shell structure using the same Hidekazu Nakamoto, Seijiro Todori 2007-07-31
7223983 Charged particle beam column Takaho Yoshida, Tomonori Nakano 2007-05-29
7211804 Chromatic aberration corrector for charged particles and charged-particle optical apparatus using the corrector Takaho Yoshida 2007-05-01
7199365 Electron beam apparatus with aberration corrector Takaho Yoshida, Yoichi Ose, Hideo Todokoro 2007-04-03
7120124 Load-distribution method and apparatus based on the method Hitoshi Yamada 2006-10-10
7107348 Packet relay processing apparatus Kuniaki Shimada, Ken Yokoyama, Toshihiko Kurita, Tsuneo Katsuyama, Koichi Takaba +1 more 2006-09-12