NH

Norio Hasegawa

HI Hitachi: 63 patents #147 of 28,497Top 1%
RT Renesas Technology: 25 patents #39 of 3,337Top 2%
HH Hitachi High-Technologies: 9 patents #300 of 1,917Top 20%
AZ Azbil: 4 patents #48 of 257Top 20%
HE Hitachi Kokusai Electric: 4 patents #206 of 843Top 25%
MC Mitsumi Electric Co.: 4 patents #208 of 935Top 25%
SO Sony: 2 patents #12,963 of 25,231Top 55%
Dai Nippon Printing Co.: 2 patents #976 of 2,222Top 45%
FI Fujifilm Business Innovation: 1 patents #3,579 of 5,238Top 70%
HC Hitachi Automotive Engineering Co.: 1 patents #156 of 314Top 50%
HE Hitachi Vlsi Engineering: 1 patents #390 of 666Top 60%
SC Shin-Etsu Handotai Co.: 1 patents #385 of 679Top 60%
📍 Tokyo, WA: #10 of 89 inventorsTop 15%
Overall (All Time): #10,371 of 4,157,543Top 1%
118
Patents All Time

Issued Patents All Time

Showing 51–75 of 118 patents

Patent #TitleCo-InventorsDate
6686107 Method for producing a semiconductor device Shunichi Matsumoto, Yasuhiro Yoshitake, Takeshi Kato 2004-02-03
6686099 Method of manufacturing a photomask Toshihiko Tanaka, Tsuneo Terasawa 2004-02-03
6677107 Method for manufacturing semiconductor integrated circuit device, optical mask used therefor, method for manufacturing the same, and mask blanks used therefor Tsuneo Terasawa, Toshihiko Tanaka 2004-01-13
6667135 Method of manufacturing a photomask Toshihiko Tanaka, Tsuneo Terasawa 2003-12-23
6660438 Method of manufacturing an electronic device and a semiconductor integrated circuit device Toshihiko Tanaka 2003-12-09
6656646 Fabrication method of semiconductor integrated circuit device Shoji Hotta 2003-12-02
6656645 Method of manufacturing a photomask Toshihiko Tanaka, Tsuneo Terasawa 2003-12-02
6656644 Manufacturing method of photomask and photomask Toshihiko Tanaka, Joji Okada, Kazutaka Mori, Ko Miyazaki 2003-12-02
6653052 Electron device manufacturing method, a pattern forming method, and a photomask used for those methods Toshihiko Tanaka, Hiroshi Shiraishi, Hidetoshi Satoh 2003-11-25
6649956 Semiconductor integrated circuit device and manufacturing method thereof Makoto Yoshida, Takahiro Kumauchi, Yoshitaka Tadaki, Isamu Asano, Keizo Kawakita 2003-11-18
6645856 Method for manufacturing a semiconductor device using half-tone phase-shift mask to transfer a pattern onto a substrate Toshihiko Tanaka, Tsuneo Terasawa 2003-11-11
RE38296 Semiconductor memory device with recessed array region Noboru Moriuchi, Yoshiki Yamaguchi, Toshihiko Tanaka, Yoshifumi Kawamoto, Shin Kimura +2 more 2003-11-04
6632744 Manufacturing method of semiconductor integrated circuit device Akira Imai, Katsuya Hayano 2003-10-14
6617265 Photomask and method for manufacturing the same Toshihiko Tanaka 2003-09-09
6596656 Manufacturing use of photomasks with an opaque pattern comprising an organic layer photoabsorptive to exposure light with wavelengths exceeding 200 NM Toshihiko Tanaka, Kazutaka Mori, Ko Miyazaki, Tsuneo Terasawa 2003-07-22
6576379 Phaseshift mask and manufacturing the same Toshihiko Tanaka 2003-06-10
6573546 Semiconductor integrated circuit device and process for manufacturing the same Kiyonori Ohyu, Makoto Ohkura, Aritoshi Sugimoto, Yoshitaka Tadaki, Makoto Ogasawara +2 more 2003-06-03
6558855 Phase shift mask and manufacturing the same Toshihiko Tanaka 2003-05-06
6548312 Manufacturing method of semiconductor integrated circuit devices and mask manufacturing methods Katsuya Hayano, Akira Imai, Naoko Asai, Eiji Tsujimoto, Takahiro Watanabe 2003-04-15
6538855 Magneto-resistive thin film magnetic head preventing entry of unnecessary magnetic flux and having good reproduction characteristics Akira Nakamura, Morio Kondo, Yasuhiko Shinjo, Kenji Machida, Naoto Hayashi +3 more 2003-03-25
6483136 Semiconductor integrated circuit and method of fabricating the same Makoto Yoshida, Takahiro Kumauchi, Yoshitaka Tadaki, Isamu Asano, Keizo Kawakita 2002-11-19
6403413 Manufacturing method of semiconductor integrated circuit device having a capacitor Katsuya Hayano, Akira Imai 2002-06-11
6383718 Photomask and pattern forming method employing the same Fumio Murai, Katsuya Hayano 2002-05-07
6329112 Method for measuring aberration of projection lens, method for forming patterns, mask, and method for correcting a projection lens Hiroshi Fukuda, Seiichiro Shirai, Tsuneo Terasawa, Katsuya Hayano 2001-12-11
6291847 Semiconductor integrated circuit device and process for manufacturing the same Kiyonori Ohyu, Makoto Ohkura, Aritoshi Sugimoto, Yoshitaka Tadaki, Makoto Ogasawara +2 more 2001-09-18