Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11276552 | Method for image adjustment and charged particle beam system | Yuki Tomizawa, Kazuyuki Hirao | 2022-03-15 |
| 10991542 | Charged particle beam device | Ryota Watanabe, Yuko Sasaki, Makoto Suzuki, Wataru MORI, Minoru Yamazaki | 2021-04-27 |
| 8923614 | Image processing apparatus, image processing method | Hideki ITAI, Zhigang Wang | 2014-12-30 |
| 8859962 | Charged-particle microscope | Noritsugu Takahashi, Muneyuki Fukuda, Manabu Yano, Hirohiko Kitsuki, Tomoyasu Shojo | 2014-10-14 |
| 8835844 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2014-09-16 |
| 8581186 | Charged particle beam apparatus | Makoto Suzuki | 2013-11-12 |
| 8487253 | Scanning electron microscope | Minoru Yamazaki, Akira Ikegami, Hideyuki Kazumi, Manabu Yano, Takeshi Mizuno +1 more | 2013-07-16 |
| 8080790 | Scanning electron microscope | Minoru Yamazaki, Akira Ikegami, Hideyuki Kazumi, Manabu Yano, Takeshi Mizuno +1 more | 2011-12-20 |
| 7700918 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2010-04-20 |
| 7372028 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2008-05-13 |
| 7087899 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2006-08-08 |
| 6946656 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2005-09-20 |