Issued Patents All Time
Showing 26–40 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6514175 | Hydraulic control system for transmissions | Hiroji Taniguchi, Katsumi Kono, Kenji Matsuo, Hideki Yasue, Tadashi Tamura +3 more | 2003-02-04 |
| 6504609 | Inspection method, apparatus and system for circuit pattern | Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Yasutsugu Usami, Takashi Hiroi | 2003-01-07 |
| 6493082 | Inspection method, apparatus and system for circuit pattern | Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Yasutsugu Usami, Takashi Hiroi +2 more | 2002-12-10 |
| 6480279 | Inspection method, apparatus and system for circuit pattern | Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Yasutsugu Usami, Takashi Hiroi | 2002-11-12 |
| 6476913 | Inspection method, apparatus and system for circuit pattern | Kazuhisa Machida, Mari Nozoe, Yasutsugu Usami, Takashi Hiroi, Maki Ito | 2002-11-05 |
| 6449948 | Hydraulic circuit cleaning apparatus and method | Yoshinobu Soga, Ryoji Habuchi, Shinji Kasuga, Hideki Yasue | 2002-09-17 |
| 6443871 | Control apparatus and method of belt-type continuously variable transmission | Hiroji Taniguchi, Katsumi Kono, Kenji Matsuo, Hideki Yasue, Tadashi Tamura +4 more | 2002-09-03 |
| 6421122 | Inspection method, apparatus and system for circuit pattern | Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Yasutsugu Usami, Takashi Hiroi +2 more | 2002-07-16 |
| 6405115 | Shift control system for continuously variable transmissions | Hiroji Taniguchi, Katsumi Kono, Kenji Matsuo, Hideki Yasue, Tadashi Tamura +5 more | 2002-06-11 |
| 6388747 | Inspection method, apparatus and system for circuit pattern | Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Yasutsugu Usami, Takashi Hiroi | 2002-05-14 |
| 5463459 | Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process | Minori Noguchi, Yoshimasa Ohshima, Yukio Kembo, Hidetoshi Nishiyama, Kazuhiko Matsuoka +1 more | 1995-10-31 |
| 5274434 | Method and apparatus for inspecting foreign particles on real time basis in semiconductor mass production line | Minori Noguchi, Yoshimasa Ohshima, Yukio Kembo, Yuzo Taniguchi | 1993-12-28 |
| 5233191 | Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process | Minori Noguchi, Yukio Kembo, Hiroshi Yamaguchi, Makiko Kohno, Yoshimasa Ohshima | 1993-08-03 |
| 5118239 | Cubic parking apparatus | — | 1992-06-02 |
| 4936730 | Elevated garage | — | 1990-06-26 |