Issued Patents All Time
Showing 26–50 of 52 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9934938 | Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium | Atsushi Uemoto, Xin Man | 2018-04-03 |
| 9741535 | Charged particle beam apparatus | Shota Torikawa, Atsushi Uemoto, Makoto Sato | 2017-08-22 |
| 9620333 | Charged particle beam apparatus | Satoshi Tomimatsu, Makoto Sato, Atsushi Uemoto, Yo Yamamoto | 2017-04-11 |
| 9548185 | Cross section processing method and cross section processing apparatus | Hidekazu Suzuki, Atsushi Uemoto | 2017-01-17 |
| 9455119 | Charged particle beam apparatus | Makoto Sato, Masahiro Kiyohara, Ikuko Nakatani | 2016-09-27 |
| 9368323 | Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus | Atsushi Uemoto, Xin Man | 2016-06-14 |
| 9347896 | Cross-section processing-and-observation method and cross-section processing-and-observation apparatus | Xin Man, Atsushi Uemoto | 2016-05-24 |
| 9336987 | Charged particle beam apparatus | Shota Torikawa, Makoto Sato, Atsushi Uemoto | 2016-05-10 |
| 9318303 | Charged particle beam apparatus | Xin Man, Atsushi Uemoto | 2016-04-19 |
| 9275827 | Charged particle beam apparatus having needle probe that tracks target position changes | Atsushi Uemoto, Hidekazu Suzuki, Yo Yamamoto | 2016-03-01 |
| 9269539 | Focused ion beam apparatus | Hidekazu Suzuki, Makoto Sato | 2016-02-23 |
| 9245713 | Charged particle beam apparatus | Xin Man, Atsushi Uemoto | 2016-01-26 |
| 9218939 | Focused ion beam system, sample processing method using the same, and sample processing program using focused ion beam | Shota Torikawa | 2015-12-22 |
| 9218937 | Charged particle beam apparatus having improved needle movement control | Atsushi Uemoto, Hidekazu Suzuki, Yo Yamamoto | 2015-12-22 |
| 9214316 | Composite charged particle beam apparatus | Yo Yamamoto, Xin Man | 2015-12-15 |
| 9202671 | Charged particle beam apparatus and sample processing method using charged particle beam apparatus | Xin Man, Atsushi Uemoto | 2015-12-01 |
| 9190243 | Composite charged particle beam apparatus and thin sample processing method | Hidekazu Suzuki, Shota Torikawa | 2015-11-17 |
| 9111717 | Ion beam apparatus | Yasuhiko Sugiyama, Hiroshi Oba | 2015-08-18 |
| 9080945 | Cross-section processing and observation method and cross-section processing and observation apparatus | Atsushi Uemoto, Xin Man | 2015-07-14 |
| 9024280 | Composite charged particle beam apparatus | Atsushi Uemoto, Yo Yamamoto | 2015-05-05 |
| 8822911 | Focused ion beam apparatus and method of adjusting ion beam optics | Yasuhiko Sugiyama, Toshio Doi, Hiroshi Oba | 2014-09-02 |
| 8642980 | Composite charged particle beam apparatus | Xin Man, Yo Yamamoto, Atsushi Uemoto | 2014-02-04 |
| 8637819 | Cross-section processing and observation apparatus | Makoto Sato, Hidekazu Suzuki | 2014-01-28 |
| 8191168 | Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscope | Xin Man, Kouji Iwasaki | 2012-05-29 |
| 7518109 | Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample | Yutaka Ikku, Hidekazu Suzuki | 2009-04-14 |