Issued Patents All Time
Showing 76–100 of 112 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9362087 | Charged particle beam apparatus | Jack Jau, Weiming Ren | 2016-06-07 |
| 9330987 | Hot spot identification, inspection, and review | Steve Lin, Wei FANG, Eric Ma, Zhonghua Dong, Jon Yee Chiang +2 more | 2016-05-03 |
| 9214680 | Platinum and platinum based alloy nanotubes as electrocatalysts for fuel cells | Yan Yushan | 2015-12-15 |
| 9202658 | Multi-axis magnetic lens for focusing a plurality of charged particle beams | Weiming Ren, Xuerang Hu, Xuedong Liu | 2015-12-01 |
| 9190241 | Charged particle beam apparatus | Jack Jau, Weiming Ren | 2015-11-17 |
| 9184024 | Selectable coulomb aperture in E-beam system | — | 2015-11-10 |
| 9177758 | Charged particle beam apparatus | Jack Jau, Weiming Ren, Chiyan Kuan, Yixiang Wang, Xiaoli Guo +1 more | 2015-11-03 |
| 9117626 | Energy-discrimination detection device | Weiming Ren, Shuai Li | 2015-08-25 |
| 9105440 | Apparatus of plural charged particle beams with multi-axis magnetic lens | Weiming Ren, Xuerang Hu, Xuedong Liu | 2015-08-11 |
| 9048062 | Method for improving performance of an energy filter | Weiming Ren, Shuai Li | 2015-06-02 |
| 9048063 | Electron beam apparatus | Weiming Ren, Shuai Li | 2015-06-02 |
| 9000394 | Multi-axis magnetic lens for focusing a plurality of charged particle beams | Weiming Ren | 2015-04-07 |
| 9000395 | Energy filter for charged particle beam apparatus | Weiming Ren, Shuai Li | 2015-04-07 |
| 9000370 | System and method for controlling charge-up in an electron beam apparatus | Weiming Ren | 2015-04-07 |
| 9000369 | System and method for controlling charge-up in an electron beam apparatus | Weiming Ren | 2015-04-07 |
| 8907281 | System and method for controlling charge-up in an electron beam apparatus | Weiming Ren | 2014-12-09 |
| 8835867 | Multi-axis magnetic lens for focusing a plurality of charged particle beams | Weiming Ren, Xuedong Liu | 2014-09-16 |
| 8791414 | Dynamic focus adjustment with optical height detection apparatus in electron beam system | Joe Wang, Van-Duc Nguyen, Yi Wang, Jack Jau | 2014-07-29 |
| 8624186 | Movable detector for charged particle beam inspection or review | Yi Wang, Joe Wang, Xuedong Liu | 2014-01-07 |
| 8618480 | Charged particle beam apparatus | Weiming Ren, Xiaoli Guo, Xuedong Liu | 2013-12-31 |
| 8592761 | Monochromator for charged particle beam apparatus | Weiming Ren | 2013-11-26 |
| 8519333 | Charged particle system for reticle/wafer defects inspection and review | Chiyan Kuan, Yi Wang, Chung-Shih Pan, Zhonghua Dong | 2013-08-27 |
| 8445862 | Apparatus of plural charged particle beams with multi-axis magnetic lens | Weiming Ren, Kenichi Kanai, Xuedong Liu | 2013-05-21 |
| 8436317 | Wien filter | Xuedong Liu, Weiming Ren | 2013-05-07 |
| 8421029 | Wien filter with reduced field leakage | Weiming Ren, Xuedong Liu | 2013-04-16 |