TN

Tomonori Nakamura

HK Hamamatsu Photonics K.K.: 48 patents #27 of 1,436Top 2%
SH Shinkawa: 19 patents #11 of 229Top 5%
PA Panasonic: 11 patents #2,326 of 21,108Top 15%
SE Seiko Epson: 10 patents #1,850 of 7,774Top 25%
ND Ntt Docomo: 3 patents #619 of 1,706Top 40%
KC Kansai Electric Power Co.: 3 patents #61 of 506Top 15%
Honda Motor Co.: 2 patents #8,527 of 21,052Top 45%
Sumitomo Electric Industries: 2 patents #9,741 of 21,551Top 50%
TU Tohoku University: 2 patents #330 of 1,680Top 20%
VA Valqua: 2 patents #16 of 42Top 40%
NI Nipro: 2 patents #126 of 473Top 30%
Canon: 2 patents #12,681 of 19,416Top 70%
TO Toyota: 1 patents #15,335 of 26,838Top 60%
KU Kyoto University: 1 patents #568 of 1,688Top 35%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
NC Nishikawa Rubber Co.: 1 patents #121 of 246Top 50%
Overall (All Time): #11,859 of 4,157,543Top 1%
110
Patents All Time

Issued Patents All Time

Showing 1–25 of 110 patents

Patent #TitleCo-InventorsDate
12405228 Inspection apparatus and inspection method Kenichiro IKEMURA 2025-09-02
12387309 Inspection apparatus and inspection method Kenichiro IKEMURA, Akihiro Otaka 2025-08-12
12320842 Inspection device for a semiconductor device Akihito Uchikado, Mitsunori Nishizawa 2025-06-03
12308273 Bonding apparatus and method for correcting movement amount of bonding head Makoto Takahashi 2025-05-20
12235433 Solid immersion lens unit and semiconductor inspection device Ikuo Arata, Xiangguang Mao 2025-02-25
12228515 Inspection apparatus and inspection method 2025-02-18
12222387 Semiconductor device inspection method and semiconductor device inspection apparatus Norimichi Chinone, Akira Shimase, Shigeru Eura 2025-02-11
12072289 Inspection apparatus comprising a first imager imaging fluorescence having a wavelength longer than a first wavelength and a second imager imaging fluorescence having a wavelength shorter than a second wavelength and inspection method 2024-08-27
12013349 Inspection apparatus and inspection method Kenichiro IKEMURA 2024-06-18
11910534 Mounting apparatus Koji Matsushita, Hiroshi Omata, Masahito Tsuji, Keiichi Hiruma, Mitsuteru Sakamoto +4 more 2024-02-20
11841393 Cooling unit, objective lens module, semiconductor inspection device, and semiconductor inspection method Hirotaka Nonaka, Hiroyuki Matsuura, Hirotoshi Terada 2023-12-12
11714120 Semiconductor inspection device Yoshitaka Iwaki 2023-08-01
11694324 Inspection apparatus and inspection method Kenichiro IKEMURA, Akihiro Otaka 2023-07-04
11569192 Method for producing structure, and structure Yuji Eguchi, Kohei Seyama, Hiroshi Kikuchi, Takehito Shimatsu, Miyuki UOMOTO 2023-01-31
11545462 Mounting apparatus and mounting system Toru Maeda 2023-01-03
11529165 Catheter Katsuya Miyagawa, Misa Matsumoto 2022-12-20
11512411 PTFE sheet and method for mounting die Osamu Watanabe, Yoshihito Hagiwara, Yuji Kanai 2022-11-29
11508599 Pick-up device and pick-up method Yasuyuki Matsuno, Shin Takayama, Hiroshi Omata 2022-11-22
11464750 Anticancer agent and use thereof Shohei Miyata, Susumu Kitanaka, Liyan Wang 2022-10-11
11460497 Device analysis apparatus and device analysis method Toru Matsumoto, Koichi Endo, Kazushige Koshikawa 2022-10-04
11415525 Carrier lifespan measurement method and carrier lifespan measurement device 2022-08-16
11402200 Measuring device, observing device and measuring method 2022-08-02
11387211 Bonding apparatus and bonding method Tetsuya Otani, Osamu Watanabe 2022-07-12
11296048 Semiconductor chip mounting device and method for manufacturing semiconductor device Toru Maeda 2022-04-05
11280776 Concentration measurement method and concentration measurement device 2022-03-22