Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11460497 | Device analysis apparatus and device analysis method | Toru Matsumoto, Koichi Endo, Tomonori Nakamura | 2022-10-04 |
| 11156565 | Method for inspecting semiconductor device | Toru Matsumoto | 2021-10-26 |
| 6023326 | Surveying system | Yasutaka Katayama, Kazuaki Kimura, Jun Sasagawa | 2000-02-08 |
| 5532813 | Optical distance meter and light source device used for the same | Masahiro Ohishi, Fumio Ohtomo, Kazuaki Kimura, Masaaki Yabe, Yasutaka Katayama +1 more | 1996-07-02 |