Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11967061 | Semiconductor apparatus examination method and semiconductor apparatus examination apparatus | Hirotoshi Terada | 2024-04-23 |
| 11714120 | Semiconductor inspection device | Tomonori Nakamura | 2023-08-01 |
| 11573251 | Semiconductor sample inspection device and inspection method | Yuji Nakajima, Toshiki Yamada | 2023-02-07 |
| 11209476 | Semiconductor inspection device | Tomonori Nakamura | 2021-12-28 |
| 10983162 | Semiconductor device inspection method and semiconductor device inspection device | — | 2021-04-20 |