Issued Patents All Time
Showing 1–25 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12216263 | Scanning microscope unit | Jiro Yamashita, Yasuyuki Tanabe, Shunsuke Matsuda | 2025-02-04 |
| 12117600 | Confocal microscope unit and confocal microscope | Jiro Yamashita, Yasuyuki Tanabe, Shunsuke Matsuda | 2024-10-15 |
| 12078789 | Confocal microscope unit and confocal microscope | Jiro Yamashita, Yasuyuki Tanabe, Shunsuke Matsuda | 2024-09-03 |
| 11967061 | Semiconductor apparatus examination method and semiconductor apparatus examination apparatus | Yoshitaka Iwaki | 2024-04-23 |
| 11841393 | Cooling unit, objective lens module, semiconductor inspection device, and semiconductor inspection method | Tomonori Nakamura, Hirotaka Nonaka, Hiroyuki Matsuura | 2023-12-12 |
| 11391774 | Metalens unit, semiconductor fault analysis device, and semiconductor fault analysis method | Soh UENOYAMA, Yuu Takiguchi | 2022-07-19 |
| 10607900 | Inspection system and inspection method | Shinsuke Suzuki, Shunsuke Matsuda | 2020-03-31 |
| 10578601 | Photostimulation device and photostimulation method | Naoya Matsumoto, Koyo WATANABE | 2020-03-03 |
| 10558010 | Solid immersion lens holder and image acquisition device | Ikuo Arata, Masataka IKESU | 2020-02-11 |
| 10545309 | Solid immersion lens holder and image acquisition device | Ikuo Arata, Masataka IKESU | 2020-01-28 |
| 10495896 | Optical module and observation device | Takashi Inoue | 2019-12-03 |
| 10312166 | Inspection system and inspection method | Shinsuke Suzuki, Shunsuke Matsuda | 2019-06-04 |
| 10302569 | Microscope device and image acquisition method | Naoya Matsumoto, Koyo WATANABE | 2019-05-28 |
| 10073076 | Photostimulation device and photostimulation method | Naoya Matsumoto, Koyo WATANABE | 2018-09-11 |
| 9891172 | Microscope device and image acquisition method | Naoya Matsumoto, Koyo WATANABE | 2018-02-13 |
| 9784980 | Optical module and light exposure device | Takashi Inoue | 2017-10-10 |
| 8947776 | Suction apparatus, semiconductor device observation device, and semiconductor device observation method | Hiroyuki Matsuura | 2015-02-03 |
| 8619377 | Immersion lens holding device | Ikuo Arata, Toshimichi Ishizuka | 2013-12-31 |
| 8582202 | Observing device and method | Hiroshi Tanabe | 2013-11-12 |
| 8094389 | Solid immersion lens holder | Hiroshi Tanabe | 2012-01-10 |
| 7865012 | Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis program | Toshiyuki Majima, Akira Shimase, Kazuhiro Hotta | 2011-01-04 |
| 7805691 | Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program | Toshiyuki Majima, Akira Shimase, Kazuhiro Hotta | 2010-09-28 |
| 7576928 | Solid immersion lens holder | Hiroshi Tanabe, Ikuo Arata | 2009-08-18 |
| 7576910 | Microscope and sample observation method | Ikuo Arata, Masaharu Tokiwa, Hiroshi Tanabe, Shigeru Sakamoto, Yoshio Isobe | 2009-08-18 |
| 7453567 | Fluorescence lifetime distribution image measuring system and its measuring method | Haruhisa Saitoh | 2008-11-18 |