KH

Kazuhiro Hotta

HK Hamamatsu Photonics K.K.: 11 patents #190 of 1,436Top 15%
TI Toyota Industries: 2 patents #605 of 1,610Top 40%
DE Denso: 1 patents #6,940 of 11,792Top 60%
MU Meijo University: 1 patents #35 of 103Top 35%
Overall (All Time): #330,510 of 4,157,543Top 8%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12360056 Semiconductor apparatus examination method and semiconductor apparatus examination apparatus Tomochika Takeshima, Takafumi Higuchi 2025-07-15
12211199 Method for inspecting semiconductor and semiconductor inspecting device Tomochika Takeshima, Takafumi Higuchi 2025-01-28
12094138 Semiconductor inspection device and semiconductor inspection method Tomochika Takeshima, Takafumi Higuchi 2024-09-17
12044729 Semiconductor device examination method and semiconductor device examination device Tomochika Takeshima, Takafumi Higuchi 2024-07-23
11579184 Analysis method, analysis device, analysis program, and recording medium for recording analysis program Akira Shimase 2023-02-14
11181361 Optical measurement method, optical measurement device, optical measurement program, and recording medium for recording optical measurement program Akira Shimase 2021-11-23
11062458 Appearance inspection device, transformation data generation device, and program Yoshio Yokoyama, Yoshitaka Sakamoto, Tomokazu Murata 2021-07-13
9734571 Image processing method, image processing system, and storage medium storing image processing program 2017-08-15
9536300 Image processing method, image processing system, and storage medium storing image processing program 2017-01-03
8047810 Double-headed piston type compressor Manabu Sugiura, Akio Saiki, Norikazu Deto 2011-11-01
7865012 Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis program Toshiyuki Majima, Akira Shimase, Hirotoshi Terada 2011-01-04
7805691 Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program Toshiyuki Majima, Akira Shimase, Hirotoshi Terada 2010-09-28
7752594 Semiconductor failure analysis apparatus, failure analysis method, failure analysis program, and failure analysis system Masahiro Takeda 2010-07-06
D576179 Piston for compressor Jun Kondo, Hitoshi Inukai, Hiroko Asaoka 2008-09-02