Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360056 | Semiconductor apparatus examination method and semiconductor apparatus examination apparatus | Takafumi Higuchi, Kazuhiro Hotta | 2025-07-15 |
| 12211199 | Method for inspecting semiconductor and semiconductor inspecting device | Takafumi Higuchi, Kazuhiro Hotta | 2025-01-28 |
| 12094138 | Semiconductor inspection device and semiconductor inspection method | Takafumi Higuchi, Kazuhiro Hotta | 2024-09-17 |
| 12044729 | Semiconductor device examination method and semiconductor device examination device | Takafumi Higuchi, Kazuhiro Hotta | 2024-07-23 |
| 10055638 | Image processing device, imaging device, microscope device, image processing method, and image processing program | — | 2018-08-21 |
| 9405958 | Cell analysis method, cell analysis device, and cell analysis program | Norikazu Sugiyama, Kouichi Kaneko | 2016-08-02 |
| 8885919 | Semiconductor fault analysis device and fault analysis method | — | 2014-11-11 |