Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405228 | Inspection apparatus and inspection method | Tomonori Nakamura | 2025-09-02 |
| 12392724 | Measurement device | Kengo Suzuki, Kazuya Iguchi | 2025-08-19 |
| 12387309 | Inspection apparatus and inspection method | Tomonori Nakamura, Akihiro Otaka | 2025-08-12 |
| 12013349 | Inspection apparatus and inspection method | Tomonori Nakamura | 2024-06-18 |
| 11694324 | Inspection apparatus and inspection method | Tomonori Nakamura, Akihiro Otaka | 2023-07-04 |
| 10816402 | Spectrometry device and spectrometry method | Kazuya Iguchi, Shigeru Eura, Akihiro Nakamura | 2020-10-27 |
| 10209189 | Spectrum measuring device, spectrum measuring method, and specimen container | Kengo Suzuki, Kazuya Iguchi, Shigeru Eura | 2019-02-19 |
| 10094779 | Optical measurement device and optical measurement method | Shigeru Eura, Kengo Suzuki, Kazuya Iguchi | 2018-10-09 |
| 9423339 | Spectrum measuring device and spectrum measuring method | Shigeru Eura, Kengo Suzuki, Kazuya Iguchi | 2016-08-23 |