Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12222387 | Semiconductor device inspection method and semiconductor device inspection apparatus | Norimichi Chinone, Tomonori Nakamura, Akira Shimase | 2025-02-11 |
| 12209996 | Ultrasonic testing device and ultrasonic testing method | Naohiro Hozumi, Takuto Matsui, Toru Matsumoto | 2025-01-28 |
| 11920921 | Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device | Kiyotada Hosokawa | 2024-03-05 |
| 11703389 | Light measurement device and light measurement method | Kengo Suzuki, Kazuya Iguchi | 2023-07-18 |
| 11346720 | Light measurement device and light measurement method | Kengo Suzuki, Kazuya Iguchi | 2022-05-31 |
| 11243073 | Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device | Kiyotada Hosokawa | 2022-02-08 |
| 10816402 | Spectrometry device and spectrometry method | Kenichiro IKEMURA, Kazuya Iguchi, Akihiro Nakamura | 2020-10-27 |
| 10209189 | Spectrum measuring device, spectrum measuring method, and specimen container | Kengo Suzuki, Kazuya Iguchi, Kenichiro IKEMURA | 2019-02-19 |
| 10094779 | Optical measurement device and optical measurement method | Kengo Suzuki, Kenichiro IKEMURA, Kazuya Iguchi | 2018-10-09 |
| 9423339 | Spectrum measuring device and spectrum measuring method | Kengo Suzuki, Kenichiro IKEMURA, Kazuya Iguchi | 2016-08-23 |