Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320842 | Inspection device for a semiconductor device | Tomonori Nakamura, Akihito Uchikado | 2025-06-03 |
| 10962932 | Time measurement device, time measurement method, light-emission-lifetime measurement device, and light-emission-lifetime measurement method | Ken KITAZAWA, Takashi Ito | 2021-03-30 |
| 10408874 | Light source device and inspection device | Tomonori Nakamura | 2019-09-10 |
| 10191104 | Semiconductor device inspection device and semiconductor device inspection method | Tomonori Nakamura | 2019-01-29 |
| 10139447 | Image generation apparatus and image generation method | Tomonori Nakamura | 2018-11-27 |
| 10101383 | Semiconductor device inspection device and semiconductor device inspection method | Tomonori Nakamura | 2018-10-16 |
| 9618550 | Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement target | Tomonori Nakamura, Akihiro Otaka | 2017-04-11 |
| 9618563 | Semiconductor device inspection device and semiconductor device inspection method | Tomonori Nakamura | 2017-04-11 |
| 9618576 | Apparatus for testing a semiconductor device and method of testing a semiconductor device | Akihiro Otaka, Nobuyuki Hirai, Tomonori Nakamura | 2017-04-11 |
| 9562944 | Semiconductor device inspection device and semiconductor device inspection method | Tomonori Nakamura | 2017-02-07 |
| 7619199 | Time-resolved measurement apparatus and position-sensitive election multiplier tube | Nobuyuki Hirai | 2009-11-17 |
| 7425694 | Time-resolved measurement apparatus | Nobuyuki Hirai | 2008-09-16 |
| 5866897 | Optical waveform detecting device | — | 1999-02-02 |
| 5591962 | Synchronous signal detection apparatus with a photoconductive photodetector | Musubu Koishi, Akira Takeshima | 1997-01-07 |
| 5204522 | Method for driving a photoelectric device and a method for driving an image intensifier using the photocathode device | Akira Takahashi | 1993-04-20 |