TN

Tomonori Nakamura

HK Hamamatsu Photonics K.K.: 48 patents #27 of 1,436Top 2%
SH Shinkawa: 19 patents #11 of 229Top 5%
PA Panasonic: 11 patents #2,326 of 21,108Top 15%
SE Seiko Epson: 10 patents #1,850 of 7,774Top 25%
ND Ntt Docomo: 3 patents #619 of 1,706Top 40%
KC Kansai Electric Power Co.: 3 patents #61 of 506Top 15%
Honda Motor Co.: 2 patents #8,527 of 21,052Top 45%
Sumitomo Electric Industries: 2 patents #9,741 of 21,551Top 50%
TU Tohoku University: 2 patents #330 of 1,680Top 20%
VA Valqua: 2 patents #16 of 42Top 40%
NI Nipro: 2 patents #126 of 473Top 30%
Canon: 2 patents #12,681 of 19,416Top 70%
TO Toyota: 1 patents #15,335 of 26,838Top 60%
KU Kyoto University: 1 patents #568 of 1,688Top 35%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
NC Nishikawa Rubber Co.: 1 patents #121 of 246Top 50%
Overall (All Time): #11,859 of 4,157,543Top 1%
110
Patents All Time

Issued Patents All Time

Showing 51–75 of 110 patents

Patent #TitleCo-InventorsDate
10437251 Method for specifying position, terminal device, autonomous device, and program Koji Asai, Katsushige Amano 2019-10-08
10405881 Catheter Katsuya Miyagawa, Misa Matsumoto 2019-09-10
10408874 Light source device and inspection device Mitsunori Nishizawa 2019-09-10
10371746 Heat generation point detection method and heat generation point detection device 2019-08-06
10365324 Analysis system and analysis method 2019-07-30
10330615 Analysis system and analysis method Nobuyuki Hirai 2019-06-25
10277544 Information processing apparatus which cooperate with other apparatus, and method for controlling the same Makoto Hirota, Yasuo Okutani, Kenichiro Nakagawa, Hiromi Omi, Rei Ishikawa +1 more 2019-04-30
10191104 Semiconductor device inspection device and semiconductor device inspection method Mitsunori Nishizawa 2019-01-29
10185534 Control method, controller, and recording medium Hiroto KANDA, Masafumi Okubo, Keiichi Tanaka 2019-01-22
10139447 Image generation apparatus and image generation method Mitsunori Nishizawa 2018-11-27
10139370 Inspection device and method for disposing magneto-optical crystal 2018-11-27
10101383 Semiconductor device inspection device and semiconductor device inspection method Mitsunori Nishizawa 2018-10-16
10063386 Control method, controller, and recording medium Yuji Kunitake, Ryota Miyazaki, Kohei Tahara 2018-08-28
10060975 Semiconductor device inspection device and semiconductor device inspection method 2018-08-28
10048483 Optical device for microscopic observation Ikuo Arata, Yoshihiro Ito 2018-08-14
9922552 Method of controlling device in manner free from contention among multiple controllers Katsushige Amano 2018-03-20
9844959 Recording device 2017-12-19
9825773 Device control by speech commands with microphone and camera to acquire line-of-sight information Masafumi Okubo, Keiichi Tanaka 2017-11-21
9764574 Inkjet recording apparatus 2017-09-19
9738146 Weather strip for automobiles Masayuki Daio, Noriyuki Otsuka 2017-08-22
9733297 Electric field concentration location observation device and electric field concentration location observation method 2017-08-15
9658116 Method for detecting heat generation points and device for detecting heat generate points 2017-05-23
9618550 Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement target Akihiro Otaka, Mitsunori Nishizawa 2017-04-11
9618576 Apparatus for testing a semiconductor device and method of testing a semiconductor device Akihiro Otaka, Mitsunori Nishizawa, Nobuyuki Hirai 2017-04-11
9618563 Semiconductor device inspection device and semiconductor device inspection method Mitsunori Nishizawa 2017-04-11