SS

Steven M. Shank

GU Globalfoundries U.S.: 83 patents #4 of 665Top 1%
IBM: 76 patents #914 of 70,183Top 2%
Globalfoundries: 55 patents #37 of 4,424Top 1%
ET Elpis Technologies: 1 patents #31 of 121Top 30%
GE Galileo Electro-Optics: 1 patents #18 of 38Top 50%
📍 Jericho, VT: #2 of 170 inventorsTop 2%
🗺 Vermont: #14 of 4,968 inventorsTop 1%
Overall (All Time): #2,780 of 4,157,543Top 1%
217
Patents All Time

Issued Patents All Time

Showing 201–217 of 217 patents

Patent #TitleCo-InventorsDate
7378712 Gate stacks Dale W. Martin, Michael C. Triplett, Deborah A. Tucker 2008-05-27
7342290 Semiconductor metal contamination reduction for ultra-thin gate dielectrics Jay Burnham, James R. Elliott, Kenneth R. Gault, Mousa H. Ishaq, Mary A. St. Lawrence 2008-03-11
7294554 Method to eliminate arsenic contamination in trench capacitors Marshall J. Fleming, Jr., Mousa H. Ishaq, Michael C. Triplett 2007-11-13
7291568 Method for fabricating a nitrided silicon-oxide gate dielectric Jay Burnham, James S. Nakos, James J. Quinlivan, Bernie Roque, Beth Ward 2007-11-06
7223697 Chemical mechanical polishing method Garth A. Brooks, Bruce W. Porth, Eric J. White 2007-05-29
7205216 Modification of electrical properties for semiconductor wafers Casey J. Grant, Heidi L. Greer, Michael C. Triplett 2007-04-17
7157341 Gate stacks Dale W. Martin, Michael C. Triplett, Deborah A. Tucker 2007-01-02
7101806 Deep trench formation in semiconductor device fabrication June Cline, Dinh Dang, Mark Lagerquist, Jeffrey C. Maling, Lisa Y. Ninomiya +2 more 2006-09-05
6909157 Thermal nitrogen distribution method to improve uniformity of highly doped ultra-thin gate capacitors Jay Burnham, James S. Nakos, James J. Quinlivan, Deborah A. Tucker, Beth Ward 2005-06-21
6887797 Apparatus and method for forming an oxynitride insulating layer on a semiconductor wafer Douglas A. Buchanan, Evgeni Gousev, Carol J. Heenan, Wade J. Hodge, Patrick R. Varekamp 2005-05-03
6838396 Bilayer ultra-thin gate dielectric and process for semiconductor metal contamination reduction Jay Burnham, James R. Elliott, Kenneth R. Gault, Mousa H. Ishaq, Mary A. St. Lawrence 2005-01-04
6780720 Method for fabricating a nitrided silicon-oxide gate dielectric Jay Burnham, Anthony I. Chou, Toshiharu Furukawa, Margaret L. Gibson, James S. Nakos 2004-08-24
6706644 Thermal nitrogen distribution method to improve uniformity of highly doped ultra-thin gate capacitors Jay Burnham, James S. Nakos, James J. Quinlivan, Deborah A. Tucker, Beth Ward 2004-03-16
6436196 Apparatus and method for forming an oxynitride insulating layer on a semiconductor wafer Douglas A. Buchanan, Evgeni Gousev, Carol J. Heenan, Wade J. Hodge, Patrick R. Varekamp 2002-08-20
6346487 Apparatus and method for forming an oxynitride insulating layer on a semiconductor wafer Douglas A. Buchanan, Evgeni Gousev, Carol J. Heenan, Wade J. Hodge, Patrick R. Varekamp 2002-02-12
5569355 Method for fabrication of microchannel electron multipliers Alan M. Then, Robert J. Soave, G. William Tasker 1996-10-29
5544772 Fabrication of a microchannel plate from a perforated silicon Robert J. Soave, Alan M. Then, G. William Tasker 1996-08-13