Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8927898 | Systems and method for optimization of laser beam spatial intensity profile | Brandon Turk | 2015-01-06 |
| 8183498 | Systems and method for optimization of laser beam spatial intensity profile | Brandon Turk | 2012-05-22 |
| 7679029 | Systems and methods to shape laser light as a line beam for interaction with a substrate having surface variations | — | 2010-03-16 |
| 7567607 | Very narrow band, two chamber, high rep-rate gas discharge laser system | Daniel J. W. Brown, Herve A. Besaucele, David W. Myers, Alexander I. Ershov, William N. Partlo +10 more | 2009-07-28 |
| 7471455 | Systems and methods for generating laser light shaped as a line beam | Palash P. Das, Albert Cefalo, Vitaliy Shklover, Holger Muenz | 2008-12-30 |
| 7218661 | Line selected F2 two chamber laser system | Daniel J. W. Brown, Richard L. Sandstrom, German E. Rylov, Eckehard D. Onkels, Herve A. Besaucele +8 more | 2007-05-15 |
| 7061961 | Very narrow band, two chamber, high rep-rate gas discharge laser system | Daniel J. W. Brown, Herve A. Besaucele, David W. Myers, Alexander I. Ershov, William N. Partlo +10 more | 2006-06-13 |
| 7058107 | Line selected F2 two chamber laser system | Daniel J. W. Brown, Richard L. Sandstrom, German E. Rylov, Eckehard D. Onkels, Herve A. Besaucele +8 more | 2006-06-06 |
| 6985508 | Very narrow band, two chamber, high reprate gas discharge laser system | Daniel J. W. Brown, Herve A. Besaucele, David W. Meyers, Alexander I. Ershov, William N. Partlo +10 more | 2006-01-10 |
| 6801560 | Line selected F2 two chamber laser system | Daniel J. W. Brown, Richard L. Sandstrom, German E. Rylov, Eckehard D. Onkels, Herve A. Besaucele +8 more | 2004-10-05 |
| 6625191 | Very narrow band, two chamber, high rep rate gas discharge laser system | Daniel J. W. Brown, Herve A. Besaucele, David W. Myers, Alexander I. Ershov, William N. Partlo +10 more | 2003-09-23 |
| 6147754 | Laser induced breakdown spectroscopy soil contamination probe | Gregory A. Theriault, Stephen H. Lieberman, Leonard J. Martini | 2000-11-14 |
| 6115061 | In situ microscope imaging system for examining subsurface environments | Stephen H. Lieberman, Leonard J. Martini | 2000-09-05 |
| 5991324 | Reliable. modular, production quality narrow-band KRF excimer laser | James H. Azzola, Herve A. Besaucele, Palash P. Das, Alexander I. Ershov, Igor V. Fomenkov +8 more | 1999-11-23 |