| 8927898 |
Systems and method for optimization of laser beam spatial intensity profile |
Brandon Turk |
2015-01-06 |
| 8183498 |
Systems and method for optimization of laser beam spatial intensity profile |
Brandon Turk |
2012-05-22 |
| 7679029 |
Systems and methods to shape laser light as a line beam for interaction with a substrate having surface variations |
— |
2010-03-16 |
| 7567607 |
Very narrow band, two chamber, high rep-rate gas discharge laser system |
Daniel J. W. Brown, Herve A. Besaucele, David W. Myers, Alexander I. Ershov, William N. Partlo +10 more |
2009-07-28 |
| 7471455 |
Systems and methods for generating laser light shaped as a line beam |
Palash P. Das, Albert Cefalo, Vitaliy Shklover, Holger Muenz |
2008-12-30 |
| 7218661 |
Line selected F2 two chamber laser system |
Daniel J. W. Brown, Richard L. Sandstrom, German E. Rylov, Eckehard D. Onkels, Herve A. Besaucele +8 more |
2007-05-15 |
| 7061961 |
Very narrow band, two chamber, high rep-rate gas discharge laser system |
Daniel J. W. Brown, Herve A. Besaucele, David W. Myers, Alexander I. Ershov, William N. Partlo +10 more |
2006-06-13 |
| 7058107 |
Line selected F2 two chamber laser system |
Daniel J. W. Brown, Richard L. Sandstrom, German E. Rylov, Eckehard D. Onkels, Herve A. Besaucele +8 more |
2006-06-06 |
| 6985508 |
Very narrow band, two chamber, high reprate gas discharge laser system |
Daniel J. W. Brown, Herve A. Besaucele, David W. Meyers, Alexander I. Ershov, William N. Partlo +10 more |
2006-01-10 |
| 6801560 |
Line selected F2 two chamber laser system |
Daniel J. W. Brown, Richard L. Sandstrom, German E. Rylov, Eckehard D. Onkels, Herve A. Besaucele +8 more |
2004-10-05 |
| 6625191 |
Very narrow band, two chamber, high rep rate gas discharge laser system |
Daniel J. W. Brown, Herve A. Besaucele, David W. Myers, Alexander I. Ershov, William N. Partlo +10 more |
2003-09-23 |
| 6147754 |
Laser induced breakdown spectroscopy soil contamination probe |
Gregory A. Theriault, Stephen H. Lieberman, Leonard J. Martini |
2000-11-14 |
| 6115061 |
In situ microscope imaging system for examining subsurface environments |
Stephen H. Lieberman, Leonard J. Martini |
2000-09-05 |
| 5991324 |
Reliable. modular, production quality narrow-band KRF excimer laser |
James H. Azzola, Herve A. Besaucele, Palash P. Das, Alexander I. Ershov, Igor V. Fomenkov +8 more |
1999-11-23 |