Issued Patents All Time
Showing 26–50 of 69 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9269744 | Manufacturing method of solid-state imaging apparatus | Daisuke Shimoyama, Masataka Ito | 2016-02-23 |
| 9252183 | Solid state image pickup apparatus and method for manufacturing the same | Daisuke Shimoyama, Masataka Ito, Kyouhei Watanabe | 2016-02-02 |
| 9236413 | Manufacturing method of solid-state imaging apparatus | Daisuke Shimoyama, Masataka Ito | 2016-01-12 |
| 9202834 | Electronic device, method of manufacturing the same, and camera | Masahiko Kondo | 2015-12-01 |
| 9140541 | Image measuring apparatus and image measuring method | — | 2015-09-22 |
| 9093578 | Solid-state image sensor, method of manufacturing the same, and camera | Daisuke Shimoyama | 2015-07-28 |
| 8995773 | Image measurement apparatus and method of measuring works using edge detection tools | — | 2015-03-31 |
| 8786739 | Photoelectric conversion device and imaging system | — | 2014-07-22 |
| 8581976 | Method and apparatus for reviewing defects of semiconductor device | Toshifumi Honda, Ryo Nakagaki | 2013-11-12 |
| 8452076 | Defect classifier using classification recipe based on connection between rule-based and example-based classifiers | Ryo Nakagaki, Toshifumi Honda | 2013-05-28 |
| 8354206 | Method of generating photomask data, method of fabricating photomask, non-transitory memory medium storing program for generating photomask data, method of manufacturing solid-state image sensor having microlens array and method of manufacturing microlens array | Kyouhei Watanabe, Shingo Kitamura | 2013-01-15 |
| 8209641 | Method of fabricating a photomask used to form a lens | Kyouhei Watanabe, Hitoshi Shindo, Nobuhiko Sato, Yasuhiro Sekine, Masataka Ito | 2012-06-26 |
| 8150141 | Defect classifier using classification recipe based on connection between rule-based and example-based classifiers | Ryo Nakagaki, Toshifumi Honda | 2012-04-03 |
| 7991217 | Defect classifier using classification recipe based on connection between rule-based and example-based classifiers | Ryo Nakagaki, Toshifumi Honda | 2011-08-02 |
| 7945873 | Mask pattern data generating method, information processing apparatus, photomask fabrication system, and image sensing apparatus | Kyouhei Watanabe, Hitoshi Shindo, Nobuhiko Sato, Yasuhiro Sekine, Masataka Ito | 2011-05-17 |
| 7873202 | Method and apparatus for reviewing defects of semiconductor device | Toshifumi Honda, Ryo Nakagaki | 2011-01-18 |
| 7598490 | SEM-type reviewing apparatus and a method for reviewing defects using the same | Toshifumi Honda, Ryo Nakagaki | 2009-10-06 |
| 7515764 | Image processing apparatus using morphology | Naoki Mitsutani | 2009-04-07 |
| 7358028 | Chemically amplified positive photo resist composition and method for forming resist pattern | Kenji Maruyama, Ken Miyagi, Satoshi Niikura, Satoshi Shimatani, Masahiro Masujima +3 more | 2008-04-15 |
| 7039490 | Controller for wire electric discharge machine | Kaoru Hiraga | 2006-05-02 |
| 7019246 | Controller for wire electric discharge machine | Kaoru Hiraga | 2006-03-28 |
| 6980879 | Controller for wire electric discharge machine | Kaoru Hiraga | 2005-12-27 |
| 6964838 | Positive photoresist composition | Takako Suzuki, Kenji Maruyama, Satoshi Niikura, Kousuke Doi | 2005-11-15 |
| 6794665 | Electron beam drawing apparatus | Toshihiko Horiuchi, Yoshimasa Fukushima, Masaki Mizuochi | 2004-09-21 |
| 6598480 | Vibration testing system | Toshihiko Horiuchi, Tomoyuki Hamada, Takao Konno | 2003-07-29 |