Issued Patents All Time
Showing 101–125 of 147 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9810932 | Driver chip, driver board and test method thereof, and display device | Shuai Xu, Zhengxin Zhang | 2017-11-07 |
| 9788178 | Method for acquiring recommending information, terminal, and server | Huiyun Liu, Guangjian Wang | 2017-10-10 |
| 9773083 | Post-placement and pre-routing processing of critical paths in a circuit design | Sabyasachi Das | 2017-09-26 |
| 9746428 | Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens | Shuhong Liu, Nilanjan Ghosh, Deepak Goyal | 2017-08-29 |
| 9704445 | Time-delayed discharge circuits for display panels and display devices | Wensen Shi, Shuai Xu, Yi Zheng, Zhengxin Zhang | 2017-07-11 |
| 9698675 | Driving circuit, operation method thereof and display apparatus | Zhengxin Zhang, Shuai Xu, Jie Cao | 2017-07-04 |
| 9691312 | Shift register unit, shift register and display apparatus | Yao Yu, Shuai Xu, Zhengxin Zhang, Yi Zheng | 2017-06-27 |
| 9646126 | Post-routing structural netlist optimization for circuit designs | Ruibing Lu, Aaron Ng, Sabyasachi Das | 2017-05-09 |
| 9613173 | Interactive multi-step physical synthesis | Rajat Aggarwal, Ruibing Lu, Sabyasachi Das | 2017-04-04 |
| 9564381 | Apparatus and method to monitor die edge defects | Mayue Xie, Yuan-Chuan Steven Chen | 2017-02-07 |
| 9524692 | Signal correcting method and signal correcting device | Yi Zheng, Shuai Xu, Zhengxin Zhang, Wensen Shi | 2016-12-20 |
| 9508610 | Inline measurement of molding material thickness using terahertz reflectance | Shuhong Liu, Nilanjan Ghosh, Deepak Goyal, Shripad Gokhale, Jieping Zhang | 2016-11-29 |
| 9483597 | Opportunistic candidate path selection during physical optimization of a circuit design for an IC | Sabyasachi Das, Ruibing Lu | 2016-11-01 |
| 9461137 | Tungsten silicide nitride films and methods of formation | Jothilingam Ramalingam, Rajkumar Jakkaraju, Jianxin Lei | 2016-10-04 |
| 9441952 | Metrology tool for electroless copper thickness measurement for BBUL process development monitoring | Nilanjan Ghosh, Yu-Chun Chen, Shuhong Liu | 2016-09-13 |
| 9406702 | Array substrate, method for fabricating the same and display device | — | 2016-08-02 |
| 9389064 | Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens | Shuhong Liu, Nilanjan Ghosh, Deepak Goyal | 2016-07-12 |
| 9370510 | Small molecule compounds to treat hearing loss | Robert Scott THIES, Francine S. Farouz, Chin-Chun Lu | 2016-06-21 |
| 9359213 | Plasma treatment to strengthen diamonds | William Wang | 2016-06-07 |
| 9235660 | Selective addition of clock buffers to a circuit design | Ruibing Lu, Sabyasachi Das | 2016-01-12 |
| 9207396 | Single mode optical fiber with large effective area | Runhan Wang, Shengya Long, Mengxun Sun, Hongyan ZHOU, Mingfeng Mao | 2015-12-08 |
| 9201192 | Bending insensitive single mode optical fiber | Lei Zhang, Yiwen Wu, Ming Ye, Mingfeng Mao, Ruichun Wang +1 more | 2015-12-01 |
| 9201045 | Internal and external universal EMAT inspection devices and related methods | Anouar Jamoussi, Bruce W. Maxfield | 2015-12-01 |
| D741519 | Light stick lamp | Kun Xiao, Zhifeng Bao | 2015-10-20 |
| 9159646 | Apparatus and method to monitor die edge defects | Mayue Xie, Yuan-Chuan Steven Chen | 2015-10-13 |