Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12013647 | Metrology method | Simon Gijsbert Josephus Mathijssen, Marc Johannes Noot, Kaustuve Bhattacharyya, Arie Jeffrey Den Boef, Grzegorz Grzela +4 more | 2024-06-18 |
| 11860548 | Method for characterizing a manufacturing process of semiconductor devices | Wim Tjibbo Tel, Hermanus Adrianus DILLEN, Marc Jurian Kea, Mark John Maslow, Koen Thuijs +3 more | 2024-01-02 |
| 11392044 | Method of determining a position of a feature | Marc Jurian Kea, Marcel Theodorus Maria Van Kessel, Masashi Ishibashi, Chi-Hsiang Fan, Hakki Ergün Cekli +3 more | 2022-07-19 |
| 10578980 | Method of determining a position of a feature | Marc Jurian Kea, Marcel Theodorus Maria Van Kessel, Masashi Ishibashi, Chi-Hsiang Fan, Hakki Ergün Cekli +3 more | 2020-03-03 |