MI

Masashi Ishibashi

AB Asml Netherlands B.V.: 5 patents #820 of 3,192Top 30%
Overall (All Time): #948,155 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
11774862 Method of obtaining measurements, apparatus for performing a process step, and metrology apparatus Hakki Ergün Cekli, Wendy Johanna Martina Van De Ven, Willem Seine Christian Roelofs, Elliott Gerard McNamara, Rizvi Rahman +3 more 2023-10-03
11392044 Method of determining a position of a feature Ralph Timotheus Huijgen, Marc Jurian Kea, Marcel Theodorus Maria Van Kessel, Chi-Hsiang Fan, Hakki Ergün Cekli +3 more 2022-07-19
11175591 Method of obtaining measurements, apparatus for performing a process step, and metrology apparatus Hakki Ergün Cekli, Wendy Johanna Martina Van De Ven, Willem Seine Christian Roelofs, Elliott Gerard McNamara, Rizvi Rahman +3 more 2021-11-16
10578980 Method of determining a position of a feature Ralph Timotheus Huijgen, Marc Jurian Kea, Marcel Theodorus Maria Van Kessel, Chi-Hsiang Fan, Hakki Ergün Cekli +3 more 2020-03-03
10545410 Lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product Hakki Ergün Cekli, Leon Paul VAN DIJK, Richard Johannes Franciscus Van Haren, Xing Lan Liu, Reiner Maria Jungblut +2 more 2020-01-28