Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12105432 | Metrology method and associated computer product | Maurits Van Der Schaar, Tieh-Ming Chang, Hilko Dirk Bos, Patrick Warnaar, Samira Bahrami +3 more | 2024-10-01 |
| 11448974 | Metrology parameter determination and metrology recipe selection | Mohammadreza Hajiahmadi, Olger Victor Zwier, Gonzalo Roberto Sanguinetti | 2022-09-20 |
| 10990020 | Metrology parameter determination and metrology recipe selection | Mohammadreza Hajiahmadi, Olger Victor Zwier, Gonzalo Roberto Sanguinetti | 2021-04-27 |
| 10705437 | Metrology method and apparatus, computer program and lithographic system | Mohammadreza Hajiahmadi, Murat Bozkurt, Alberto Da Costa Assafrao, Marc Johannes Noot, Simon Gijsbert Josephus Mathijssen +1 more | 2020-07-07 |