Issued Patents All Time
Showing 51–58 of 58 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7617476 | Method for performing pattern pitch-split decomposition utilizing anchoring features | Noel Corcoran, Jang Fung Chen, Douglas Van Den Broeke | 2009-11-10 |
| 7434195 | Method for performing full-chip manufacturing reliability checking and correction | Michael S. Hsu, Thomas Laidig, Kurt E. Wampler, Xuelong Shi | 2008-10-07 |
| 7433791 | Method of performing multiple stage model calibration for optical imaging simulation models | Sangbong Park, Edita Tejnil | 2008-10-07 |
| 7355673 | Method, program product and apparatus of simultaneous optimization for NA-Sigma exposure settings and scattering bars OPC using a device layout | Armin Liebchen | 2008-04-08 |
| 7138212 | Method and apparatus for performing model-based layout conversion for use with dipole illumination | Kurt E. Wampler, Markus Franciscus Antonius Eurlings, Jang Fung Chen, Noel Corcoran | 2006-11-21 |
| 7100145 | Method of identifying an extreme interaction pitch region, methods of designing mask patterns and manufacturing masks, device manufacturing methods and computer programs | Xuelong Shi, Jang Fung Chen | 2006-08-29 |
| 6875545 | Method of removing assist features utilized to improve process latitude | Markus Franciscus Antonius Eurlings, Jang Fung Chen | 2005-04-05 |
| 6792591 | Method of identifying an extreme interaction pitch region, methods of designing mask patterns and manufacturing masks, device manufacturing methods and computer programs | Xuelong Shi, Jang Fung Chen | 2004-09-14 |