YT

Yuan Tang

AM AMD: 16 patents #689 of 9,279Top 8%
WC Wuhan Xinxin Semiconductor Manufacturing Co.: 14 patents #1 of 78Top 2%
ED Eon Silicon Devices: 5 patents #1 of 8Top 15%
AT Advanced Connection Technology: 4 patents #6 of 19Top 35%
HA Hyundai Electronics America: 2 patents #38 of 148Top 30%
TU Temple University: 1 patents #135 of 364Top 40%
UT Uptake Technologies: 1 patents #33 of 71Top 50%
📍 San Jose, CA: #1,156 of 32,062 inventorsTop 4%
🗺 California: #9,453 of 386,348 inventorsTop 3%
Overall (All Time): #65,369 of 4,157,543Top 2%
45
Patents All Time

Issued Patents All Time

Showing 26–45 of 45 patents

Patent #TitleCo-InventorsDate
6172915 Unified erase method in flash EEPROM James Yu, Jeffrey W. Anthony 2001-01-09
6023426 Method of achieving narrow V.sub.T distribution after erase in flash EEPROM James Yu, Chien-Sheng Su 2000-02-08
5966330 Method and apparatus for measuring the threshold voltage of flash EEPROM memory cells being applied a variable control gate bias Chien-Sheng Su 1999-10-12
5920506 Method and apparatus for bulk preprogramming flash memory cells with minimal source and drain currents Hsingya Arthur Wang, Haike Dong, Jein-Chen Young, Aaron Yip, Kenneth Miu 1999-07-06
5882985 Reduction of field oxide step height during semiconductor fabrication Hsingya Arthur Wang, Ming Sang Kwan 1999-03-16
5869385 Selectively oxidized field oxide region Mark T. Ramsbey 1999-02-09
5854108 Method and system for providing a double diffuse implant junction in a flash device James Hsu, Jian Chen 1998-12-29
5852582 Non-volatile storage device refresh time detector Lee Cleveland, Jonathan S. Su, Chi Chang, Chung K. Chang 1998-12-22
5831901 Method of programming a memory cell to contain multiple values Qimeng Zhou, Hsingya Arthur Wang 1998-11-03
5805502 System for constant field erasure in a FLASH EPROM Chi Chang, James Yu 1998-09-08
5652447 Flash EEPROM memory with reduced column leakage current Jian Chen, Scott Luning, Salvatore F. Cagnina 1997-07-29
5650964 Method of inhibiting degradation of ultra short channel charge-carrying devices during discharge Jian Chen, James Hsu, Shengwen Luan, David Kuan-Yu Liu, Michael A. Van Buskirk 1997-07-22
5642311 Overerase correction for flash memory which limits overerase and prevents erase verify errors Lee Cleveland, Chung K. Chang, Nancy Leong, Michael Fliesler, Tiao-Hua Kuo 1997-06-24
5629893 System for constant field erasure in a flash EPROM Chi Chang, James Yu 1997-05-13
5629892 Flash EEPROM memory with separate reference array 1997-05-13
5608672 Correction method leading to a uniform threshold voltage distribution for a flash eprom Jian Chen, Chung K. Chang 1997-03-04
5596531 Method for decreasing the discharge time of a flash EPROM cell David Kuan-Yu Liu, Ming Sang Kwan, Chi Chang, Sameer Haddad 1997-01-21
5485423 Method for eliminating of cycling-induced electron trapping in the tunneling oxide of 5 volt only flash EEPROMS Chi Chang, Michael A. Van Buskirk, Chung K. Chang 1996-01-16
5482881 Method of making flash EEPROM memory with reduced column leakage current Jian Chen, Scott Luning, Salvatore F. Cagnina 1996-01-09
5481494 Method for tightening VT distribution of 5 volt-only flash EEPROMS Lee Cleveland 1996-01-02