PW

Peter Wrschka

AC Advanced Technology & Materials Co.: 5 patents #85 of 410Top 25%
Infineon Technologies Ag: 3 patents #2,452 of 7,486Top 35%
IBM: 2 patents #32,839 of 70,183Top 50%
EN Entegris: 1 patents #376 of 643Top 60%
Overall (All Time): #460,275 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9586188 Fluid processing systems and methods Steven M. Lurcott, John E. Q. Hughes, Thomas H. Baum, Donald D. Ware, Peng Zou 2017-03-07
9038855 Fluid processing systems and methods Steven M. Lurcott, John E. Q. Hughes, Thomas H. Baum, Donald D. Ware, Peng Zou 2015-05-26
8507382 Systems and methods for delivery of fluid-containing process material combinations John E. Q. Hughes, Donald D. Ware, Steven M. Lurcott 2013-08-13
8304344 High throughput chemical mechanical polishing composition for metal film planarization Karl E. Boggs, Michael S. Darsillo, James Welch 2012-11-06
8236695 Method of passivating chemical mechanical polishing compositions for copper film planarization processes Jun Liu, Mackenzie King, Michael S. Darsillo, Karl E. Boggs, Jeffrey F. Roeder +1 more 2012-08-07
7736405 Chemical mechanical polishing compositions for copper and associated materials and method of using same Michael S. Darsillo, Karl E. Boggs 2010-06-15
7300601 Passivative chemical mechanical polishing composition for copper film planarization Jun Liu, David Bernhard, Mackenzie King, Michael S. Darsillo, Karl E. Boggs 2007-11-27
6943114 Integration scheme for metal gap fill, with fixed abrasive CMP Werner Robl, Thomas Goebel 2005-09-13
6899597 Chemical mechanical polishing (CMP) process using fixed abrasive pads Alexander William Simpson 2005-05-31
6740539 Carbon-graded layer for improved adhesion of low-k dielectrics to silicon substrates Richard A. Conti, Prakash Dev, David M. Dobuzinsky, Daniel C. Edelstein, Gill Yong Lee +3 more 2004-05-25
6570256 Carbon-graded layer for improved adhesion of low-k dielectrics to silicon substrates Richard A. Conti, Prakash Dev, David M. Dobuzinsky, Daniel C. Edelstein, Gill Yong Lee +3 more 2003-05-27