Issued Patents 2022
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11449711 | Machine learning-based defect detection of a specimen | Ran BADANES, Ran Schleyen, Irad Peleg, Denis Suhanov, Ore SHTALRID | 2022-09-20 |
| 11423529 | Determination of defect location for examination of a specimen | Doron Girmonsky, Rafael Ben Ami, Dror Shemesh | 2022-08-23 |
| 11379972 | Detecting defects in semiconductor specimens using weak labeling | Irad Peleg, Ran Schleyen | 2022-07-05 |
| 11360030 | Selecting a coreset of potential defects for estimating expected defects of interest | Yotam Sofer, Shaul Engler, Saar Shabtay, Amir Bar, Marcelo BACHER | 2022-06-14 |
| 11348224 | Mask inspection of a semiconductor specimen | Ariel Shkalim, Vladimir OVECHKIN, Evgeny Bal, Ronen Madmon, Ori Petel +2 more | 2022-05-31 |
| 11348001 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2022-05-31 |
| 11321633 | Method of classifying defects in a specimen semiconductor examination and system thereof | Assaf Asbag, Shiran Gan-Or | 2022-05-03 |
| 11276160 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Ishai Schwarzband, Ariel Shkalim, Evgeny Bal | 2022-03-15 |
| 11263741 | System and methods of generating comparable regions of a lithographic mask | Gadi Greenberg, Sivan Lifschitz, Shay Attal, Oded O. Dassa, Ziv Parizat | 2022-03-01 |