Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11449711 | Machine learning-based defect detection of a specimen | Ran BADANES, Boaz Cohen, Irad Peleg, Denis Suhanov, Ore SHTALRID | 2022-09-20 |
| 11379972 | Detecting defects in semiconductor specimens using weak labeling | Irad Peleg, Boaz Cohen | 2022-07-05 |