Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11348224 | Mask inspection of a semiconductor specimen | Vladimir OVECHKIN, Evgeny Bal, Ronen Madmon, Ori Petel, Alexander Chereshnya +2 more | 2022-05-31 |
| 11276160 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Ishai Schwarzband, Boaz Cohen, Evgeny Bal | 2022-03-15 |