Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Yan Avniel, Sergey Khristo, Mor Baram, Shimon Levi, Doron Girmonsky +1 more | 2022-04-12 |
| 11276160 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Boaz Cohen, Ariel Shkalim, Evgeny Bal | 2022-03-15 |