Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Mor Baram, Doron Girmonsky +1 more | 2022-04-12 |
SL
Shimon Levi
Overall (2022): #261,582 of 548,613Top 50%
1
Patents 2022