Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11423529 | Determination of defect location for examination of a specimen | Rafael Ben Ami, Boaz Cohen, Dror Shemesh | 2022-08-23 |
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Mor Baram, Shimon Levi +1 more | 2022-04-12 |