Issued Patents 2022
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11476081 | Evaluating an intermediate product related to a three-dimensional NAND memory unit | Vadim Vereschagin, Assaf Shamir, Elad Sommer, Sharon Duvdevani-Bar, Meng Li Cecilia Lim | 2022-10-18 |
| 11455715 | Epitaxy metrology in fin field effect transistors | Jitendra Pradipkumar Chaudhary, Ran Alkoken, Sahar LEVIN, Chih-Chieh Chang, Einat Frishman | 2022-09-27 |
| 11443420 | Generating a metrology recipe usable for examination of a semiconductor specimen | Grigory Klebanov, Einat Frishman, Tal Orenstein, Meir Vengrover, Noa Marom +3 more | 2022-09-13 |
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Mor Baram, Shimon Levi +1 more | 2022-04-12 |
| 11276160 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Ishai Schwarzband, Boaz Cohen, Ariel Shkalim, Evgeny Bal | 2022-03-15 |