Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11443420 | Generating a metrology recipe usable for examination of a semiconductor specimen | Roman Kris, Einat Frishman, Tal Orenstein, Meir Vengrover, Noa Marom +3 more | 2022-09-13 |