Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11526979 | Method of defect classification and system thereof | Orly ZVITIA, Idan Kaizerman, Efrat Rosenman | 2022-12-13 |
| 11321633 | Method of classifying defects in a specimen semiconductor examination and system thereof | Boaz Cohen, Shiran Gan-Or | 2022-05-03 |