Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11321633 | Method of classifying defects in a specimen semiconductor examination and system thereof | Assaf Asbag, Boaz Cohen | 2022-05-03 |
SG
Shiran Gan-Or
Overall (2022): #263,505 of 548,613Top 50%
1
Patents 2022