Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11526979 | Method of defect classification and system thereof | Assaf Asbag, Orly ZVITIA, Efrat Rosenman | 2022-12-13 |
| 11348001 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2022-05-31 |