Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11348001 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff +1 more | 2022-05-31 |