Issued Patents 2020
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876959 | Method and system for optical characterization of patterned samples | Dror Shafir, Shay Wolfling, Michal Haim YACHINI, Matthew Sendelbach, Cornel Bozdog | 2020-12-29 |
| 10761036 | Method and system for optical metrology in patterned structures | Boris Levant, Yanir Hainick, Vladimir Machavariani, Roy Koret | 2020-09-01 |
| 10732116 | Hybrid metrology method and system | Yanir Hainick, Yonatan Oren | 2020-08-04 |
| 10663408 | Optical phase measurement system and method | Dror Shafir, Yanir Hainick, Shahar Gov | 2020-05-26 |
| 10564106 | Raman spectroscopy based measurements in patterned structures | Yanir Hainick, Yonatan Oren, Vladimir Machavariani | 2020-02-18 |