Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 10876959 | Method and system for optical characterization of patterned samples | Gilad Barak, Shay Wolfling, Michal Haim YACHINI, Matthew Sendelbach, Cornel Bozdog | 2020-12-29 | $14,373,000 |
| 10739277 | Optical system and method for measurements of samples | Yoav Berlatzky, Valery Deich, Danny Grossman | 2020-08-11 | $11,233,000 |
| 10663408 | Optical phase measurement system and method | Gilad Barak, Yanir Hainick, Shahar Gov | 2020-05-26 | $8,694,000 |