Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876959 | Method and system for optical characterization of patterned samples | Gilad Barak, Shay Wolfling, Michal Haim YACHINI, Matthew Sendelbach, Cornel Bozdog | 2020-12-29 |
| 10739277 | Optical system and method for measurements of samples | Yoav Berlatzky, Valery Deich, Danny Grossman | 2020-08-11 |
| 10663408 | Optical phase measurement system and method | Gilad Barak, Yanir Hainick, Shahar Gov | 2020-05-26 |