Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10761036 | Method and system for optical metrology in patterned structures | Boris Levant, Vladimir Machavariani, Roy Koret, Gilad Barak | 2020-09-01 |
| 10732116 | Hybrid metrology method and system | Gilad Barak, Yonatan Oren | 2020-08-04 |
| 10663408 | Optical phase measurement system and method | Gilad Barak, Dror Shafir, Shahar Gov | 2020-05-26 |
| 10564106 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yonatan Oren, Vladimir Machavariani | 2020-02-18 |