Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10761036 | Method and system for optical metrology in patterned structures | Boris Levant, Yanir Hainick, Roy Koret, Gilad Barak | 2020-09-01 |
| 10564106 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yanir Hainick, Yonatan Oren | 2020-02-18 |