Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10732116 | Hybrid metrology method and system | Gilad Barak, Yanir Hainick | 2020-08-04 |
| 10564106 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yanir Hainick, Vladimir Machavariani | 2020-02-18 |