Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 10761036 | Method and system for optical metrology in patterned structures | Boris Levant, Yanir Hainick, Vladimir Machavariani, Gilad Barak | 2020-09-01 | $10,557,000 |