Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10761036 | Method and system for optical metrology in patterned structures | Yanir Hainick, Vladimir Machavariani, Roy Koret, Gilad Barak | 2020-09-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10761036 | Method and system for optical metrology in patterned structures | Yanir Hainick, Vladimir Machavariani, Roy Koret, Gilad Barak | 2020-09-01 |