MY

Michal Haim YACHINI

NI Nova Measuring Instruments: 1 patents #15 of 33Top 50%
Overall (2020): #339,862 of 565,922Top 65%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10876959 Method and system for optical characterization of patterned samples Dror Shafir, Gilad Barak, Shay Wolfling, Matthew Sendelbach, Cornel Bozdog 2020-12-29