Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876959 | Method and system for optical characterization of patterned samples | Dror Shafir, Gilad Barak, Shay Wolfling, Michal Haim YACHINI, Matthew Sendelbach | 2020-12-29 |
| 10707211 | Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry | Abhilasha Bhardwaj, Byeung Chul Kim, Michael E. Koltonski, Gurtej S. Sandhu, Matthew Thorum | 2020-07-07 |
| 10533961 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Mark Klare | 2020-01-14 |
| 10534275 | Method for use in process control of manufacture of patterned sample | Aron Cepler, Paul ISBESTER | 2020-01-14 |