Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876959 | Method and system for optical characterization of patterned samples | Dror Shafir, Gilad Barak, Shay Wolfling, Michal Haim YACHINI, Cornel Bozdog | 2020-12-29 |
| 10664638 | Measuring complex structures in semiconductor fabrication | Taher Kagalwala, Sridhar Mahendrakar, Alok Vaid | 2020-05-26 |