| 10522639 |
Methods, apparatus and system for stringer defect reduction in a trench cut region of a finFET device |
Hui Zang, Haigou Huang, Veeraraghavan S. Basker, Christopher Nassar, Jinsheng Gao +1 more |
2019-12-31 |
| 10460986 |
Cap structure |
Jinsheng Gao, Chih-Chiang Chang, Michael V. Aquilino, Patrick Carpenter, Junsic Hong +3 more |
2019-10-29 |
| 10418455 |
Methods, apparatus and system for stringer defect reduction in a trench cut region of a finFET device |
Hui Zang, Haigou Huang, Veeraraghavan S. Basker, Christopher Nassar, Jinsheng Gao +1 more |
2019-09-17 |
| 10388562 |
Composite contact etch stop layer |
Haigou Huang, Xusheng Wu, Jinsheng Gao |
2019-08-20 |
| 10373875 |
Contacts formed with self-aligned cuts |
Ruilong Xie, Chanro Park, Laertis Economikos, Haiting Wang, Hui Zang |
2019-08-06 |
| 10340142 |
Methods, apparatus and system for self-aligned metal hard masks |
Jinsheng Gao, Michael V. Aquilino, Patrick Carpenter, Jiehui Shu, Pei Liu +1 more |
2019-07-02 |
| 10325819 |
Methods, apparatus and system for providing a pre-RMG replacement metal contact for a finFET device |
Jinsheng Gao, Michael V. Aquilino, Patrick Carpenter, Jessica Dechene, Huy Cao +2 more |
2019-06-18 |
| 10269654 |
Methods, apparatus and system for replacement contact for a finFET device |
Jinsheng Gao, Michael V. Aquilino, Patrick Carpenter, Jessica Dechene, Huy Cao +2 more |
2019-04-23 |
| 10249616 |
Methods of forming a resistor structure between adjacent transistor gates on an integrated circuit product and the resulting devices |
Hui Zang, Manfred Eller, Haiting Wang |
2019-04-02 |
| 10204797 |
Methods, apparatus, and system for reducing step height difference in semiconductor devices |
Jinsheng Gao, Michael V. Aquilino, Patrick Carpenter, Junsic Hong, Jessica Dechene +1 more |
2019-02-12 |
